Radioelektronikos terminų žodynas. – Vilnius : BĮ UAB „Litimo“. Kazimieras Gaivenis, Gytis Juška, Vidas Kalesinskas. 2000.
voltage prod — voltmetro liestukas statusas T sritis radioelektronika atitikmenys: angl. voltage probe; voltage prod vok. Spannungsmeßspitze, f rus. щуп вольтметра, m pranc. sonde de voltmètre, f … Radioelektronikos terminų žodynas
Laser Voltage Prober — The Laser Voltage Probe (LVP) is a laser based voltage and timing waveform acquisition system which is used to perform failure analysis on flip chip integrated circuits. The device to be analyzed is de encapsulated in order to expose the silicon… … Wikipedia
Test probe — Typical passive oscilloscope probe being used for testing an integrated circuit. A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to the device under test (DUT). They range from… … Wikipedia
Langmuir probe — A Langmuir probe is a device named after Nobel Prize winning physicist Irving Langmuir, used to determine the electron temperature, electron density, and electric potential of a plasma. It works by inserting one or more electrodes into a plasma,… … Wikipedia
Mercury probe — The Mercury Probe is an electrical probing device to make rapid, non destructive contact to a sample for electrical characterization. Its primary application is semiconductor measurements where time consuming metallizations or photolithographic… … Wikipedia
Scanning voltage microscopy — (SVM) sometimes also called nanopotentiometry is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or… … Wikipedia
Kelvin probe force microscope — Kelvin probe force microscopy ( KPFM ), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM) that was [http://dns.ntu ccms.ntu.edu.tw/references/APPL PHYS LETT 58 2921 1991.pdf invented] in 1991.… … Wikipedia
Scanning probe microscopy — Part of a series of articles on Nanotechnology … Wikipedia
Huygens probe — Infobox Spacecraft Name = Huygens probe Caption = A scale replica of the probe, 1.3 metres across. Organization = ESA/ASI/NASA Major Contractors = Aérospatiale, now Thales Alenia Space Mission Type = Lander Satellite Of = Saturn Launch = December … Wikipedia
Atom probe — The atom probe is an atomic resolution microscope used in materials science that was invented in 1967 by Erwin Müller, J. A. Panitz, and S. Brooks McLane [cite journal|last=Müller|first=Erwin W.|authorlink=Erwin Müller|coauthors=John A. Panitz, S … Wikipedia
